We are excited to announce several test system-focused presentations
Managing Test Systems and Engineering Data like a boss with NI SystemLink
Mark Lee – Cloud Systems Developer, CTA, CLA
NI’s flagship server-based management system contains many shiny new toys, but isn’t well understood by the community yet. Take a look under the hood at what you get to play with and be inspired to go cloud
Simplify Test Development with the Bloomy EFT Module for TestStand
Richard Grzebieta – Wired-in Software
The Bloomy EFT Module for TestStand helps you create and run automated tests for electronic devices. It offers features such as hardware and measurements abstraction (HAL/MAL), operator interface, database connectivity, and result processing
In this presentation, you will learn how the Bloomy EFT Module for TestStand can reduce your test system development effort by applying their built-in HAL/MAL, which allows you to easily configure and access various hardware platforms such as PXI, Serial USB instruments, etc. You will also see how the device functions are easily imported into TestStand using custom step types, which enable you to perform common operations such as power on/off, read/write, measure, etc. without writing any code. Finally, you will discover how the tool can help you define communication interfaces for non-typical devices that use serial, GPIB, XNET, etc., and avoid custom code development for each device
This presentation will provide an overview of the tool, with live demonstrations on how to use it. Learn how you could apply this tool in your next test system.
Robust Test Limits – A Quality Cost Advantage
Chris Turner – ResMed
I intend to challenge the use of Datasheet / OEM provided System Specifications as not ideal in certain Manufacturing Test situations. “Outlier Detection” I will argue is a fundamental feature of high quality systems and will show how to drive corporate-image, quality and cost improvements via optimising Test Limits.
Stay tuned for more presentation announcements coming soon!